1. In for Integrated Circuits-Level Testing and Test During Burn-Wafer
پدیدآورنده : / Bahukudumbi, Sudarshan
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : ELECTRONIC&ENGINEERING, ELECTRICAL
رده :
E-BOOK
2. Wafer-level testing and test during burn-in for integrated circuits /
پدیدآورنده : Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,TECHNOLOGY & ENGINEERING-- Electronics-- Digital.,TECHNOLOGY & ENGINEERING-- Electronics-- Microelectronics.
رده :
TK7874
.
B35
2010
3. Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
پدیدآورنده : Bahukudumbi, Sudarshan.
کتابخانه: Library and Information Center of Ayatollah Imani of Salman Farsi University (Fars)
موضوع : Integrated circuits, Testing,Integrated circuits, Wafer-scale integration,Semiconductors, Testing
رده :
TK
7874
.
B22W3
2010
